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Able Electropolishing Introduces Fourth Generation Scanning Electron Microscope

Joining Able’s suite of analytic tools, JCM-7000 NeoScope Benchtop SEM offers a comprehensive analysis of surface defects and material composition.

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By: Rachel Klemovitch

Assistant Editor

Able Electropolishing has bolstered its analytic capabilities with a fourth generation scanning electron microscope (SEM) for the aerospace, medical device, semiconductor, and electric vehicle manufacturing industries. The JCM-7000 joins a suite of other in-house analytic tools that include a digital microscope and a 3D surface profiler.
 
The JCM-7000 NeoScope Benchtop SEM features a powerful platform for the measurement and analysis of surface defects as well as elemental analysis. With part magnification up to 100,000X, the JCM-7000 can analyze a wide range of sample types and sizes using a high-resolution W filament source and a combination of secondary and backscatter electron (BSE) detectors. It also uses high and low vacuum modes.
 
Able President Brian Glass commented, “The ability to provide in-house analytic testing and reporting is a great benefit to our customers, eliminating the extra step of having to contract with outside laboratories and also providing insight and validation of the electropolishing services we provide.”
 
With the ability to provide detailed before and after imagery, elemental analysis, and 3D surface profiling, Able Electropolishing can provide visual and metrological validation to specifications and processes, providing the manufacturers of increasingly sophisticated metal parts with the ability see the effects of metal polishing on their parts in comprehensive detail.
 

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